T4CIA’09 国际会议论文征集

国际会议论文征集

"关键工业应用的测试技术和工具"，集中在性能测试、可靠性测试方面的技术和工具

论文提交截止日期：4月20日

http://cn.siemens.com/cms/cn/English/it-solutions/home/Pages/UpcomingEvents.aspx#CallforPapers

Call for Papers

Testing Technologies and Tools for Critical Industry Applications (T4CIA’09)

The 1st Workshop in conjunction withSSIRI 2009
(3rd IEEE Conference on Secure Software Integration and Reliability Improvement)

General Information

The large amount of applications in industrial sectors (e.g. telecom, medical, and energy) has many mission critical issues (e.g. security, reliability). The competence of industry applications to ensure the critical missions determines the competitive strengths in the market. On one hand, industrial companies have introduced and developed testing technologies and tools in industrial contexts, and applied them in these applications. On the other hand, academic researchers have produced and performed theoretical or experimental research for the similar topics. This workshop aims to increase scientific interaction and cooperation between academic researchers and industrial practitioners in the area of critical industry applications. It provides an excellent platform for the exchange of ideas, discussion, cross-fertilization, inspiration, and co-operation. Both researchers and practitioners will present their results and experience to a broader audience.

Scope of the Workshop

The topics of interest include, but are not limited to:
•Methods, techniques and tools to support testing
•Different aspects of testing including functional, performance, security, etc.
•System specification and validation
•Application of model checking in testing
•Model based testing
•Testing processes in industry
•Theoretical foundations in testing
•Case studies and experience reports on critical industrial applications

Important Dates

April 20: Submission deadline
May 7: Notification date
May 20: Camera-ready

Submission, Workshop Proceedings, Paper Presentation

Submit original papers (not published or submitted elsewhere) with a maximum of 10 pages. Include the title of the paper, the name and affiliation of each author, a 150-word abstract, and up to 8 keywords. The format of your submission must follow the IEEE conference proceedings format.

Please submit your paper at http://paris.utdallas.edu/ssiri09/start/www/T4CIA/.
Or visit the conference website http://paris.utdallas.edu/ssiri09, click on "Paper Submission" in the left menu, and select “Submit papers to Testing Technologies and Tools for Critical Industry Applications (T4CIA’09)"

Accepted submissions will be published by IEEE Press and available in the IEEE digital library. One of the authors needs to register and present the accepted submission. Each paper has 30 minutes, with 20-25 minute presentation.

Organizers

Bao Tang (bao.tang@siemens.com) Siemens IT Solutions and Services, China
Jun Pang (jun.pang@uni.lu) University of Luxembourg, Luxembourg

Please do not hesitate to contact us by email if you have any question or remarks.

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转载于:http://blog.itpub.net/15232605/viewspace-592197/

标签：industrial,http,征集,09,T4CIA,critical,testing,20
来源： https://blog.csdn.net/cuicongpo1225/article/details/100460177